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Showing results: 211 - 222 of 222 items found.

  • Production Test System

    ETS880 TITAN - Hilevel Technology, Inc.

    *Test rates up to 200MHz (100MHz All Modes) *Clocks up to 400MHz *Two strobes per cycle * High Pin Count: Up to 1,024 logic pins in ONE Chassis *Optionally supports up 4,096 DC pins, or combination of both * Direct Docking precision manipulator *Low Cost *Up to 64Meg test vector depth *Programmable loads and parallel loads *Multiple DC PMU units * Timing On-the-Fly * Mixed Signal Option

  • Cable Modem Test Platform

    Promptlink Communications, Inc.

    CMTP has broad support for the mixed environment of DOCSIS 3.0, and earlier devices. Similarly, it supports all DOCSIS/Euro DOCSIS equipment vendors, impartially treating each vendor's devices with maximum performance and minimum hassle.CMTP is fully automated, requiring no user input for testing.CMTP tests the basic Cable Modem, Wi-Fi and EMTA parameters such as signal levels, signal to noise ratio, etc. as well as device throughput and packet loss. For PacketCable devices, CMTP tests each phone port individually, with maximum functionality being tested.CMTP can also be configured to upgrade the firmware of the devices in a multi-step and conditional process.

  • Build to Print

    ARC Technology Solutions

    In today’s fast paced manufacturing environment, where time to market and cost competitiveness is key, having a manufacturing partner like ARC can be a valuable resource for your company. ARC has a build-to-print manufacturing capability with our unique ‘engineer-to-print’ philosophy to make sure precision manufacturing and final build accuracy is top priority for your module level or system level builds. ARC can support up to several hundred module level assemblies (CCA subassemblies, cabling, mechanical and paneling elements) with abilities to perform a variety of software, embedded tasks and functional testing including a mixed signal test capability using our in-house MSAT (Mixed Signal Automated Tester) platform. We have a thorough process created through the development of our own products and test solutions. We know the importance of having a regimented manufacturing process, augmented with engineering expertise to address challenges that come up with building complex, high-mix, medium volume products.

  • USB Oscilloscope & Logic Analyzer

    Analog Discovery - Digilent Inc.

    The USB-powered Analog Discovery lets you measure, visualize, analyze, record, and control mixed analog and digital signal circuits of all kinds. It's small enough to fit in your pocket, but powerful enough to replace a stack of lab equipment. Driven by the free original WaveForms software, the Analog Discovery digital oscilloscope lets you build and test analog and digital circuits in virtually any environment, in or out of the lab.

  • SoC Test System

    V93000 SoC / Smart Scale - Advantest Corp.

    Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.

  • JTAG Functional Test

    JFT - JTAG Technologies Inc.

    JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)

  • AMIDA 5000 Tester

    Amida Technology, Inc.

    AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.

  • Component Test and Analysis Laboratories

    Raytheon Company

    The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.

  • Package Test Loadboards/DIB

    Dynamic Test Solutions

    DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.

  • Automated Multi-Functional Tester

    QTouch 1408 C - Qmax Test Technologies Pvt. Ltd.

    QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.

  • GoldenGate RFIC Simulation Software

    Keysight Technologies

    GoldenGate RFIC Simulation and Analysis Software is an advanced simulation and analysis solution for integrated mixed signal RFIC designs that is fully integrated into the Cadence Analog Design Environment (ADE). GoldenGate is part of Keysight's RFIC simulation, analysis and verification solution that also includes Momentum for 3-D planar electromagnetic simulation, SystemVue & Ptolemy wireless test benches for system-level verification, and the Advanced Design System (ADS) Data Display for advanced data analysis. This suite links the RF system, subsystem, and component-level design and analysis as part of a unique and comprehensive RFIC design flow.

  • Muzzle Velocity Radars

    MVR Series - Innovative Technical Systems

    The MVR Series of Muzzle-Velocity Radars are Doppler-CW transceivers that measure the velocity of viewed objects such as projectiles. They use phase-locked millimeter-wave transmitter-receivers along with an integrated radome-protected antenna to illuminate objects under investigation. An optical boresighting aid provides alignment assistance for the narrow radiation patterns. Reflected signals from the target are received by the antenna and mixed to produce a video output equal to the Doppler spectrum of the target. A low-noise, variable gain video amplifier can drive a 50-ohm cable up to +1 volt output. The video amplifier has a feed-forward DC offset compensation circuit that extends the Doppler frequency response from under 1 Hz to over 2 MHz. An integrated DMM and LCD display on the front panel monitors various test points within the sensor to verify proper operation. The extremely rugged design allows the MVRs to withstand high acousitic shock environments so they can be located in close proximity to the projectile source.

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